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HomeTechElectronic TechnologySiC JFETs enhance system reliability under stress

SiC JFETs enhance system reliability under stress

SiC JFETs enhance system reliability under stress

CoolSiC JFETs from Infineon provide low conduction losses and robust turn-off behavior for solid-state protection and power distribution. Their strong short-circuit capability, linear-mode thermal stability, and accurate overvoltage control make them well-suited for solid-state circuit breakers, automotive battery disconnect switches, and industrial safety relays.

The bulk-channel optimized JFETs offer RDS(on) values as low as 1.5 mΩ for 750 V devices and 2.3 mΩ for 1200 V variants. Housed in a top-side cooled Q-DPAK, they enable straightforward paralleling and scalable current handling. Consistent switching performance under thermal stress and fault conditions ensures reliable operation in demanding environments.

Engineering samples of the new CoolSiC JFET devices will be available in late 2025, with volume production beginning in 2026. The portfolio will expand to include a range of packages and modules. For more information, click here.

Infineon Technologies 

The post SiC JFETs enhance system reliability under stress appeared first on EDN.

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